Test Solution

  • Memory Module Test : Probe System using RF Probe tip, Active probe tip 
  • High Speed Test : PCB, Module TDR, S-parameter Test
  • High Power Test : High Power device test 
  • LCR Test : Measurement of component and PCB LCR values ​​in a specific frequency range 
  • Thermal Test : Used for electrical test stations using FLIR's R&D camera
  • Vacuum Chamber probing : Electrical test under low, high temperature and vacuum conditions 
  • mmW Test : Radar, ultra-high frequency measurement system
  • Antenna chamber probing : RF tip probing in chamber for antenna 


  mmW Test (Ladar, Lidar, Flexible waveguide etc.)