Test Solutions

• Memory Module Test : Probe System using RF Probe tip, Active probe tip 
• High Speed Test : PCB, Module TDR, S-parameter Test
• High Power Test : High Power device test 
• LCR Test : Measurement of component and PCB LCR values ​​in a specific frequency range 
• Thermal Test : Used for electrical test stations using FLIR's R&D camera
• Vacuum Chamber probing : Electrical test under low, high temperature and vacuum conditions 
• mmW Test : Radar, ultra-high frequency measurement system
• Antenna chamber probing : RF tip probing in chamber for antenna 

  mmW Test (Ladar, Lidar, Flexible waveguide etc.)